1998 IEEE International Conference on Microelectronic Test Structures


Slight bump to head of spine.; 8x11 1/2"

Title: 1998 IEEE International Conference on Microelectronic Test Structures

Author Name: IEEE, Electron Devices Society Staff; Institute of Electrical and Electronics Engineers, Inc. Staff (editor)

Categories: Other,

Edition: First Edition

Publisher: Piscataway, NJ, U.S.A., Institute of Electrical & Electronics Engineers, Incorporated: 1998

ISBN Number: 0780343484

ISBN Number 13: 9780780343481

Binding: Original Wraps

Book Condition: Fine with no dust jacket

Seller ID: 7819

Keywords: Microelectronics Technology Electronics